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Scanning Force Microscopy With Applications to Electric, Magnetic, and Atomic Forces [Repost]

Автор: Bo0mB0om » 7 ноября 2015
Scanning Force Microscopy With Applications to Electric, Magnetic, and Atomic Forces [Repost]

Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces by Dror Sarid
English | 1 July 1994 | ISBN: 019509204X | 284 Pages | PDF | 11 MB

This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.



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