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Characterization of High Tc Materials and Devices by Electron Microscopy

Автор: Bo0mB0om » 4 марта 2016
Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy by Nigel D. Browning and Stephen J. Pennycook
English | ISBN: 052155490X | 2000 | PDF | 406 pages | 13,4 mb



This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques and microanalysis by scanning transmission electron microscopy.


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